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1

VNA calibration

Rumiantsev, Andrej, Ridler, Nick

Journal:

IEEE Microwave Magazine

Année:

2008

Langue:

english

Fichier:

PDF, 3.13 MB

english, 2008

2

[IEEE 2007 69th ARFTG Conference - Honolulu, HI, USA (2007.06.8-2007.06.8)] 2007 69th ARFTG Conference - A bilateral comparison of on-wafer S-parameter measurements at millimeter wavelengths

Clarke, Roland G., Quraishi, Jemeela, Ridler, Nick M.

Année:

2007

Langue:

english

Fichier:

PDF, 5.43 MB

english, 2007

3

Industry news - News to use new electric power developments

Horibe, Masahiro, Ridler, Nick M.

Journal:

IEEE Power and Energy Magazine

Année:

2005

Langue:

english

Fichier:

PDF, 58 KB

english, 2005

4

3-D Printed Metal-Pipe Rectangular Waveguides

D Auria, Mario, Otter, William J., Hazell, Jonathan, Gillatt, Brendan T. W., Long-Collins, Callum, Ridler, Nick M., Lucyszyn, Stepan

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology

Année:

2015

Langue:

english

Fichier:

PDF, 2.36 MB

english, 2015

5

Development of a very light rail vehicle

Winnett, James, Hoffrichter, Andreas, Iraklis, Athanasios, McGordon, Andy, Hughes, Darren J., Ridler, Tony, Mallinson, Nick

Journal:

Proceedings of the ICE - Transport

Année:

2016

Langue:

english

Fichier:

PDF, 466 KB

english, 2016

6

An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

Votsi, Haris, Li, Chong, Aaen, Peter H., Ridler, Nick M.

Journal:

IEEE Microwave and Wireless Components Letters

Année:

2017

Langue:

english

Fichier:

PDF, 732 KB

english, 2017

7

Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models

Stant, Laurence T., Salter, Martin J., Ridler, Nick M., Williams, Dylan F., Aaen, Peter H.

Journal:

IEEE Transactions on Microwave Theory and Techniques

Année:

2018

Langue:

english

Fichier:

PDF, 3.68 MB

english, 2018

8

[IEEE 2019 92nd ARFTG Microwave Measurement Symposium (ARFTG) - Orlando, FL, USA (2019.1.19-2019.1.22)] 2019 92nd ARFTG Microwave Measurement Conference (ARFTG) - Preliminary Study on WM-380 Waveguide TRL Calibration Line Standards at the UK's National Physical Laboratory

Shang, Xiaobang, Ridler, Nick, Sun, Wenjuan, Cooper, Peter, Wilson, Alan

Année:

2019

Langue:

english

Fichier:

PDF, 780 KB

english, 2019

9

[IEEE 2011 77th ARFTG Microwave Measurement Conference (ARFTG) - Baltimore, MD, USA (2011.06.10-2011.06.10)] 77th ARFTG Microwave Measurement Conference - New calibration technique for coaxial network analyzer reflection measurements at millimeter-wave frequencies

Horibe, Masahiro, Ridler, Nick, Salter, Martin, Eio, Christopher

Année:

2011

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2011

10

[IEEE 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008) - Broomfield, CO, USA (2008.06.8-2008.06.13)] 2008 Conference on Precision Electromagnetic Measurements Digest - A bilateral comparison of measurement of diameters and characteristic impedance of precision 3.5 mm coaxial air lines

Masahiro Horibe,, Ridler, Nick

Année:

2008

Langue:

english

Fichier:

PDF, 449 KB

english, 2008

11

[IEEE 56th ARFTG Conference Digest - Boulder, AZ, USA (2000.11.30-2000.12.1)] 56th ARFTG Conference Digest - Evaluating and expressing uncertainty in complex S-parameter measurements

Ridler, Nick M., Salter, Martin J.

Année:

2000

Langue:

english

Fichier:

PDF, 150 KB

english, 2000

12

[IEEE 58th ARFTG Conference Digest - San Diego, CA, USA (2001.11.29-2001.11.30)] 58th ARFTG Conference Digest - Propagating S-parameter uncertainties to other measurement quantities

Ridler, Nick M, Salter, Martin J

Année:

2001

Langue:

english

Fichier:

PDF, 197 KB

english, 2001

13

[IEEE 2006 67th ARFTG Conference - San Francisco, CA, USA (2006.06.16-2006.06.16)] 2006 67th ARFTG Conference - Using simple calibration load models to improve accuracy of Vector Network Analyzer measurements

Ridler, Nick M., Nazoa, Nils

Année:

2006

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2006

14

Determining the high-frequency resistivity of slightly lossy coaxial air lines

Ridler, Nick M, Shelton, Dexter J

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 506 KB

english, 2012

15

Rectangular waveguide enabling technology using holey surfaces and wire media metamaterials

Papantonis, Stergios, Ridler, Nick M., Lucyszyn, Stepan

Journal:

Sensors and Actuators A: Physical

Année:

2014

Langue:

english

Fichier:

PDF, 2.61 MB

english, 2014

16

100GHz ultra-high Q-factor photonic crystal resonators

Otter, William J., Hanham, Stephen M., Ridler, Nick M., Marino, Giuseppe, Klein, Norbert, Lucyszyn, Stepan

Journal:

Sensors and Actuators A: Physical

Année:

2014

Langue:

english

Fichier:

PDF, 3.16 MB

english, 2014

17

[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - Traceability via precision dimensional measurements of WM-864 (WR-03) waveguide standard shims including comparison between NPL and NMIJ

Horibe, Masahiro, Ridler, Nick, Wilson, Alan

Année:

2012

Langue:

english

Fichier:

PDF, 1.96 MB

english, 2012

18

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

Ridler, Nick, Clarke, Roland, Salter, Martin, Wilson, Alan

Année:

2010

Langue:

english

Fichier:

PDF, 577 KB

english, 2010

19

[IEEE 2010 75th ARFTG Microwave Measurement Conference - Anaheim, CA, USA (2010.05.28-2010.05.28)] 75th ARFTG Microwave Measurement Conference - Inter-laboratory comparison of reflection and transmission measurements in WR-06 waveguide (110 GHz to 170 GHz)

Ridler, Nick, Salter, Martin, Goy, Philippe, Caroopen, Sylvain, Watts, James, Clarke, Roland, Lau, Yuenie, Linton, David, Dickie, Raymond, Huggard, Peter, Henry, Manju, Hesler, Jeffrey, Barker, Scott,

Année:

2010

Langue:

english

Fichier:

PDF, 2.15 MB

english, 2010

20

[IEEE 2009 73rd ARFTG Microwave Measurement Conference (ARFTG) - Boston, MA, USA (2009.06.12-2009.06.12)] 2009 73rd ARFTG Microwave Measurement Conference - Recommendations for waveguide sizes at submillimeter wavelengths

Année:

2009

Langue:

english

Fichier:

PDF, 1.95 MB

english, 2009

21

[IEEE 2012 80th ARFTG Microwave Measurement Conference - San Diego, CA, USA (2012.11.29-2012.11.30)] 80th ARFTG Microwave Measurement Conference - Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies

Shelton, Dexter, Salter, Martin, Ridler, Nick, Horibe, Masahiro

Année:

2012

Langue:

english

Fichier:

PDF, 847 KB

english, 2012

22

[IEEE 2009 73rd ARFTG Microwave Measurement Conference (ARFTG) - Boston, MA, USA (2009.06.12-2009.06.12)] 2009 73rd ARFTG Microwave Measurement Conference - Traceability to national standards for S-parameter measurements of waveguide devices from 110 GHz to 170 GHz

Clarke, Roland, Pollard, Roger, Ridler, Nick, Salter, Martin, Wilson, Alan

Année:

2009

Langue:

english

Fichier:

PDF, 11.73 MB

english, 2009

23

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Characterization and verification of coaxial open-circuit primary standards for millimeter-wave vector network analyzer calibration

Horibe, Masahiro, Ridler, Nick, Salter, Martin, Eio, Christopher

Année:

2010

Langue:

english

Fichier:

PDF, 1.32 MB

english, 2010

24

[IEEE 2013 82nd ARFTG Microwave Measurement Conference - Columbus, OH, USA (2013.11.18-2013.11.21)] 82nd ARFTG Microwave Measurement Conference - A new technique for vector network analyzer calibration verification using a single reconfigurable device

Papantonis, Stergios, Ridler, Nick M., Lucyszyn, Stepan

Année:

2013

Langue:

english

Fichier:

PDF, 571 KB

english, 2013

25

[IEEE 2009 74th ARFTG Microwave Measurement Conference - Broomfield, CO, USA (2009.11.30-2009.12.4)] 2009 74th ARFTG Microwave Measurement Conference - Verifying transmission phase measurements at millimeter wavelengths using beadless air lines

Horibe, Masahiro, Ridler, Nick M.

Année:

2009

Langue:

english

Fichier:

PDF, 568 KB

english, 2009

26

The Trace Is on Measurements: Developing Traceability for S?Parameter Measurements at Millimeter and Submillimeter Wavelengths

Ridler, Nick, Clarke, Roland, Salter, Martin, Wilson, Alan

Journal:

IEEE Microwave Magazine

Année:

2013

Langue:

english

Fichier:

PDF, 2.16 MB

english, 2013

27

[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Bilateral comparison of 1.85 mm coaxial air line dimensional and characteristic impedance measurements between NPL and NMIJ

Horibe, Masahiro, Ridler, Nick

Année:

2010

Langue:

english

Fichier:

PDF, 1.13 MB

english, 2010

28

[IEEE 2008 72nd ARFTG Microwave Measurement Symposium - Portland, OR, USA (2008.12.9-2008.12.12)] 2008 72nd ARFTG Microwave Measurement Symposium - Comparison between root-impulse-energy and vector network analyzer methods for measuring loss on printed circuit boards

Harper, Matthew R., Ridler, Nick M., Salter, Martin J

Année:

2008

Langue:

english

Fichier:

PDF, 765 KB

english, 2008

29

Evaluating and expressing uncertainty in high-frequency electromagnetic measurements: a selective review

Ridler, Nick M, Salter, Martin J

Journal:

Année:

2014

Langue:

english

Fichier:

PDF, 3.50 MB

english, 2014

30

Reconfigurable Waveguide for Vector Network Analyzer Verification

Papantonis, Stergios, Ridler, Nick M., Wilson, Alan, Lucyszyn, Stepan

Journal:

IEEE Transactions on Microwave Theory and Techniques

Année:

2014

Langue:

english

Fichier:

PDF, 1.23 MB

english, 2014

31

[IEEE 2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) - Hong Kong, China (2015.8.23-2015.8.28)] 2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) - A comparison method for THz measurements using VNA and TDS

Naftaly, Mira, Ridler, Nick, Molloy, John, Shoaib, Nosherwan, Stokes, Daniel

Année:

2015

Langue:

english

Fichier:

PDF, 188 KB

english, 2015

32

Establishing Traceability to the International System of Units for Scattering Parameter Measurements From 750 GHz to 1.1 THz

Ridler, Nick M., Clarke, Roland G.

Journal:

IEEE Transactions on Terahertz Science and Technology

Année:

2016

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2016

33

ARFTG May 2015

Blackham, Dave, Ridler, Nick, Sayed, Mohamed, Cable, John

Journal:

IEEE Microwave Magazine

Année:

2015

Fichier:

PDF, 844 KB

2015

34

ARFTG May 2015

Blackham, Dave, Ridler, Nick, Sayed, Mohamed, Cable, John

Journal:

IEEE Microwave Magazine

Année:

2015

Langue:

english

Fichier:

PDF, 844 KB

english, 2015

35

[IEEE 2015 85th ARFTG Microwave Measurement Conference (ARFTG) - Phoenix, AZ, USA (2015.5.22-2015.5.22)] 2015 85th Microwave Measurement Conference (ARFTG) - Analyzing uncertainty matrices associated with multiple S-parameter measurements

Ridler, Nick M., Salter, Martin J.

Année:

2015

Langue:

english

Fichier:

PDF, 2.63 MB

english, 2015

36

Faster than a Speeding Bullet ... [From the Guest Editor's Desk]

Journal:

IEEE Microwave Magazine

Année:

2013

Langue:

english

Fichier:

PDF, 5.94 MB

english, 2013

37

Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer

Naftaly, Mira, Shoaib, Nosherwan, Stokes, Daniel, Ridler, Nick M.

Journal:

Journal of Infrared, Millimeter and Terahertz Waves

Année:

2016

Langue:

english

Fichier:

PDF, 659 KB

english, 2016

38

3-D Printed Variable Phase Shifter

Gillatt, Brendan T. W., D'Auria, Mario, Otter, William J., Ridler, Nick M., Lucyszyn, Stepan

Journal:

IEEE Microwave and Wireless Components Letters

Année:

2016

Langue:

english

Fichier:

PDF, 629 KB

english, 2016

39

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

Naftaly, Mira, Clarke, Roland G., Humphreys, David A., Ridler, Nick M.

Journal:

Proceedings of the IEEE

Année:

2017

Langue:

english

Fichier:

PDF, 2.01 MB

english, 2017

40

Evaluation of cross-connected waveguides as transfer standards of transmission at high millimetre-wave frequencies

Ridler, Nick, Clarke, Roland, Huang, Hui, Zinal, Sherko

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 898 KB

english, 2016

41

[IEEE 2016 IEEE 9th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT) - Qingdao, China (2016.9.5-2016.9.7)] 2016 IEEE 9th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT) - Evaluation of a VNA-based material characterization kit at frequencies from 0.75 THz to 1.1 THz

Khalid, Ata, Cumming, David, Clarke, Roland, Li, Chong, Ridler, Nick

Année:

2016

Langue:

english

Fichier:

PDF, 291 KB

english, 2016

42

Guest Editorial

Journal:

IET Microwaves Antennas & Propagation

Année:

2017

Langue:

english

Fichier:

PDF, 340 KB

english, 2017

43

Evaluating residual errors in waveguide VNAs from microwave to submillimetre-wave frequencies

Stant, Laurence, Aaen, Peter, Ridler, Nick

Journal:

IET Microwaves Antennas & Propagation

Année:

2017

Langue:

english

Fichier:

PDF, 2.25 MB

english, 2017

44

[IEEE 2017 10th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT) - Liverpool, United Kingdom (2017.9.11-2017.9.13)] 2017 10th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT) - Benchmarking electrical loss in rectangular metallic waveguide at submillimeter wavelengths

Ridler, Nick, Li, Chong

Année:

2017

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2017

45

ARFTG 2017

Aaen, Peter H., Ridler, Nick

Journal:

IEEE Microwave Magazine

Année:

2017

Langue:

english

Fichier:

PDF, 980 KB

english, 2017

46

The MTT-S Standards Coordinating Committee-Developing IEEE Standards [MTT World]

Journal:

IEEE Microwave Magazine

Année:

2016

Langue:

english

Fichier:

PDF, 7.61 MB

english, 2016

47

A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model

Liu, Chen, Wu, Aihua, Li, Chong, Ridler, Nick

Journal:

IEEE Transactions on Microwave Theory and Techniques

Année:

2018

Langue:

english

Fichier:

PDF, 2.27 MB

english, 2018

48

[IEEE 2007 70th ARFTG Microwave Measurement Conference (ARFTG) - Tempe, AZ (2007.11.29-2007.11.30)] 2007 70th ARFTG Microwave Measurement Conference (ARFTG) - Using time-domain measurements to improve assessments of precision coaxial air lines as standards of impedance at microwave frequencies

Horibe, Masahiro, Ridler, Nick

Année:

2007

Langue:

english

Fichier:

PDF, 4.85 MB

english, 2007

49

Establishing a New Form of Primary Impedance Standard at Millimeter-Wave Frequencies

Azeez, Yasameen F., Collier, Richard J., Ridler, Nick M., Young, Paul R.

Journal:

IEEE Transactions on Instrumentation and Measurement

Année:

2018

Langue:

english

Fichier:

PDF, 1.62 MB

english, 2018

50

Strategies for Traceable Submillimeter-wave Vector Network Analyzer Measurements

Ridler, Nick, Clarke, Roland, Li, Chong, Salter, Martin J.

Journal:

IEEE Transactions on Terahertz Science and Technology

Année:

2019

Langue:

english

Fichier:

PDF, 523 KB

english, 2019